发明名称 Tip attachment for circuit probe tester
摘要 The attachment consists of a single length of resilient wire formed into a coil spring portion, a probe engaging portion and an elongated tip portion. The tip portion extends forwardly from the coil spring portion in a direction generally parallel to the probe and has a uniform cross-sectional dimension throughout its length. A radially extending portion of the wire is bent to form a recess adapted to engage the insulated wire of the probe, so as to retain the attachment when not in use.
申请公布号 US4978312(A) 申请公布日期 1990.12.18
申请号 US19890414586 申请日期 1989.10.24
申请人 S & G TOOL AID CORP. 发明人 FODALI, ADOLPH
分类号 G01R1/067;H01R11/18 主分类号 G01R1/067
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