发明名称 Iterative self-aligned contact metallization process
摘要 A method is provided for forming multiple layers of interconnections adjacent a planar surface. A first insulator layer is formed adjacent the selected planar surface. A first conductor layer is formed adjacent the first insulator layer. A second insulator is formed adjacent the first conductor layer. A first cavity and a second cavity are formed, each having sidewalls extending through said second insulator layer and said first conductor layer. The first cavity is formed wider than the second cavity. A third insulator layer is conformally deposited adjacent the second insulator layer, such that sidewall insulators are deposited on sidewalls of the first cavity and such that the second cavity is substantially filled with insulator. An etch is performed through the first cavity to expose a portion of the planar surface. A second conductor layer is conformally deposited adjacent third insulator layer such that second conductor layer extends through the first cavity to contact the planar surface.
申请公布号 US5122859(A) 申请公布日期 1992.06.16
申请号 US19910693884 申请日期 1991.05.01
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 COLEMAN, JR., DONALD J.
分类号 H01L21/768 主分类号 H01L21/768
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