发明名称 INTERATOMIC FORCE MICROSCOPE
摘要 PURPOSE:To provide an interatomic force microscope capable of radiating the excitation light to a sample without being shielded by a cantilever. CONSTITUTION:A probe 12 is provided at the free end of a cantilever 14, and both of them are made of an optically transparent material. The cantilever 14 is fitted to a disk-like glass plate 16 having an opening at the center so that the probe 12 is located at the center of the opening. An optically transparent conducting film 18 is provided below the probe 12, cantilever 14, and glass plate 16, and an interference reflecting film 20 is provided above the free end section of the cantilever 14 (the face on the opposite side to the probe 12). The interference reflecting film 20 reflects only the displacement detection light from an optical fiber interferometer within the light emitted from the optical fiber 34 and transmits the other light. The glass plate 16 is fitted to a support member 22 together with an objective lens 24, and it is supported by a cylindrical piezoelectric actuator 26.
申请公布号 JPH05141961(A) 申请公布日期 1993.06.08
申请号 JP19910305998 申请日期 1991.11.21
申请人 OLYMPUS OPTICAL CO LTD 发明人 TAKASE TSUGIKO
分类号 G01B21/30;G01N21/63;G01N37/00;G01Q20/02;G01Q30/02;G01Q60/04;G01Q60/10;G01Q60/24;H01J37/28 主分类号 G01B21/30
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