发明名称 PROBER FOR SEMICONDUCTOR WAFER
摘要 <p>PURPOSE:To control a noise caused by impedance, by shortening a conductive path when a voltage is applied to the rear of a semiconductor wafer. CONSTITUTION:An electrode plate 11 supplied from a DUT board 1 is installed on the bottom of the DUT board 1. pogo pins 15, which are electrically connected to a chuck top 4 and are connectably installed to the electrode plate 11, are provided on the side of the chuck top 4. Since a potential is applied on the chuck top 4 by contacting the pogo pins 15 with the electrode plate 11, a short, conductive path between the chuck top 4 and a power source is obtained. Thus, the potential is applied on the chuck top 4 through the short wiring and a noise caused by impedance is controlled.</p>
申请公布号 JPH05198633(A) 申请公布日期 1993.08.06
申请号 JP19920009066 申请日期 1992.01.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 KAWAI MAKOTO
分类号 G01R31/26;H01L21/66;H01L21/677;H01L21/68 主分类号 G01R31/26
代理机构 代理人
主权项
地址