发明名称 METHOD FOR THE EXAMINATION OF CONTINUOUSLY CONVEYED WORKPIECES
摘要 1090-31 A METHOD FOR THE EXAMINATION OF CONTINUOUSLY CONVEYED WORKPIECES A method for the examination of continuously conveyed workpieces and more particularly for the examination of the configuration of folds, or of bay ends, or the printed matter on bags, is provided using a CCD semiconductor camera. The image produced by the camera is visually examined, or compared, with a master which corresponds to the desired form of the workpiece. In order to be able to perform the examination of the workpieces on a short conveying path, sequential images, of which there are at least two, are produced of the part of the workpiece to be examined. The images are then assembled to constitute the complete area to be compared to the master. The use of partial sequential images permits the examination to be performed in a smaller area of the apparatus. This allows existing machines to accommodate the required devices without expensive modification.
申请公布号 CA2097001(A1) 申请公布日期 1993.11.28
申请号 CA19932097001 申请日期 1993.05.26
申请人 WINDMOELLER & HOELSCHER 发明人 MANEKE, SIEGFRIED;MAREK, RAINER;SANDKAEMPER, HORST
分类号 G01B11/24;B29C65/82;B31B19/74;B31B29/00;G01B11/245;G01N21/84;G01N21/88;G06T1/00 主分类号 G01B11/24
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