| 摘要 |
PURPOSE:To observe the measurement position of a specimen clearly without an visual difference for positioning by specifying the configuration of the hemi sphere prism of ATR crystal in micro ATR measurement. CONSTITUTION:The ATR measurement is used for measuring the total reflection attenuation characteristics of a specimen S according to the attenuation of total reflection light on a plane by adhering the plane of a hemisphere prism 1 to the surface of the specimen and 0.95<=n'/n0'<=1.05 is satisfied when the radius of the hemisphere prism 1 ranges from 2 to 10mm, the refractive index with a wavelength of 400nm to 800nm is set to n', and the center value is set to n0'. When the refractive index with a wavelength of 2.5 to 10mum is set to n and the center value is set to n0, 0.98<=n/n0<=1.02 and ¦(n0'--n0)/(n0'+n0)¦<=0.05 are satisfied. For example, zinc sulfide is used. |
