| 摘要 |
<p>PURPOSE:To attain miniaturization of a semiconductor integrated circuit with a built-in optical sensor having a test terminal for function test. CONSTITUTION:When a test signal is applied to a test terminal 4, a reference voltage as a grounded potential supplied to supply terminals 3B, 3D-3F for reference voltage is supplied to arithmetic circuits 6, 7 instead of a detected voltage converted from the respective detected currents of a photosensor 1B corresponding to the arithmetic circuit 6 and photosensors 1D-1F corresponding to the arithmetic circuit 7. The arithmetic circuit 6 outputs a detected voltage converted from the detected current of a photosensor 1A and a function signal based on a reference voltage and the arithmetic circuit 7 computes a detected voltage converted from the detected current of a photosensor IC and a function signal based on three reference voltages. When the function of the arithmetic circuits is normal, the function signal according to the unbalance between the detection signal and the reference signal is outputted. Consequently, one test terminal is enough and the circuit is made small in size.</p> |
