Schieberegisterzelle einer Prüfschaltung zur Implementierung einer taktgesteuerten Schieberegisterprüfarchitektur(Boundary-Scan)

摘要

Of the four combined shift register cells, one (ASC1) is provided with an input selector (MUX3) and a gate for feedback connection to the neighbouring cells. Another input selector and gate (TR2) allow the feedback shift register combination thus constituted to operate alternatively as a test pattern generator or a test response processor. A NOR gate affords a further choice in the test pattern generation mode between linear and nonlinear feedback shift register configurations. ADVANTAGE - Widely applicable shift register cell meets requirements for performing or assisting test on other components not featuring boundary-scan test circuit.