Collision-free test operation of analog and pref. digital circuits

摘要

The device under test (P) is connected with automatic test equipment (ATE) via a bidirectional data line (DL). Stimulus data are transmitted to the device from the test equipment, and response data are stored in the memory of the latter.Both sets of data are propagated at finite speed so that periods of transmission and reception can succeed each other at intervals of e.g 20 ns, with suitable choice of the repetition frequency and/or line length.