发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To obviate the short-circuit defects in the packaging time of semiconductor device thereby enhancing the yield of an electronic device by removing at least a part of the second wiring layer on the periphery of an outer lead hole. CONSTITUTION:A Cu conductor layer and an insulating tape 2 formed on the rear surface are patterned by photolithographic and etching technologies so as to make a device hole and an outer lead hole. At this time, the second wiring layer 4 is removed on the periphery of an outer lead hole. Thus, even if an outer lead 3c is bent on the insulating tape 2 side near the terminal end of the insulating tape 2 to be soldered onto a printed substrate 6, the solder 7 for packaging the outer lead 3c does not come into contact with the second conductor layer 4. Accordingly, the outer lead 3c is not short-circuited with the second conductor layer 4 thereby enabling the short-circuit defects in the packaging time to be obviated further enhancing the yield of an electrode device.</p>
申请公布号 JPH0778845(A) 申请公布日期 1995.03.20
申请号 JP19930160921 申请日期 1993.06.30
申请人 HITACHI LTD;HITACHI MICOM SYST:KK 发明人 YAMAZAKI KAZUO;ICHIHARA SEIICHI
分类号 H01L21/60;H01L23/12;H05K3/34;(IPC1-7):H01L21/60 主分类号 H01L21/60
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