| 摘要 |
FIELD: measuring equipment.SUBSTANCE: invention relates to measurement equipment and can be used during the destruction processes research of materials with formation of cracks. Essence: initial length is measured. In the test processes heat flux power is measured from the test sample, and crack growth rate is determined by formula. Device includes a sensor in contact with the sample, and information processing device from the sensor, including direct voltage source, an amplifier, a microcontroller, a personal computer. Sensor includes two Peltier elements, made in the form of the flat plates. First Peltier element is in contact with the sample by one side of the plate, and with the second Peltier element by the other side. Device additionally comprises a radiator in contact with the second side of the second Peltier element, and two thermocouples, one of which is located between the Peltier elements, and the second is located in the place of constant temperature. Information processing device additionally comprises a field-effect transistor and a bypass resistor, wherein the amplifier is connected to the first Peltier element, with two thermocouples, shunting resistor, installed between joints of the amplifier with first Peltier element, and the second thermocouple and microcontroller. Field-effect transistor is installed in the microcontroller connection circuit with the second Peltier element and a DC voltage source. Microcontroller is made with a possibility of pulse-width modulation of power supply voltage and is connected to a personal computer.EFFECT: increase of measurement accuracy, simplified design, expanded operating performances.2 cl, 4 dwg |
