发明名称 SYNTHETIC BREAKING TEST CIRCUIT FOR SWITCH
摘要 <p>PURPOSE:To provide a synthetic breaking test circuit by which a hardly attenuated zero miss current can be obtained. CONSTITUTION:When AC voltages of generators 5 and 10 of electric current source circuits 1 and 2 reach a zero point, a first closing switch 6 is closed. At this time, an electric current 11 containing DC equivalence close to 100% flows to the secondary side of a first transformer 8, and this also flows to a specimen HGSG4. When generating voltages of the first generator 5 and the second generator 10 come to the next zero point after the first closing switch 6 is closed, a second closing switch 11 is closed. When the second closing switch 11 is closed, an electric current (i2) containing DC equivalence close to 100% similarly flows from the second electric current source circuit 2. From this time, a zero miss electric current (i0) by synthsizing an electric current (i1) and the electric current (i2) flows to a specimen switch 4. A second auxiliary circuit breaker 14 is opened in time such as becoming arc time not less than prescribed 80ms, and a zero point is created in the zero miss electric current (i0), and in succession, a first auxiliary circuit breaker 9 is opened, and is simultaneously broken at the same electric current zero point with the specimen switch 4.</p>
申请公布号 JPH07248362(A) 申请公布日期 1995.09.26
申请号 JP19940040166 申请日期 1994.03.10
申请人 TOSHIBA CORP 发明人 MIYAKE NOBUYUKI;SAIGOU HISANOBU;KUDO KIETSU;SUZUKI KATSUMI;YAMASHITA SHOJI
分类号 G01R31/327;G01R31/333;(IPC1-7):G01R31/327 主分类号 G01R31/327
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