发明名称 |
FABRICATION OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE:To provide a method for forming a thin film transistor in a liquid crystal display in which the contact resistance between an a-Si layer and an ITO film is lowered and the opening rate is increased while simplifying the process. CONSTITUTION:The method for fabricating a semiconductor device comprises a step for forming an insulating film 27b on a semiconductor layer 26a, and a step for exposing the semiconductor layer 26a to a low energy plasma containing one conductivity type impurities and to a high energy plasma gas containing one conductivity type impurity to form superposed shallow and deep impurity introduced layers in the semiconductor layer 26a on the opposite sides of the insulating film 27b.</p> |
申请公布号 |
JPH07249776(A) |
申请公布日期 |
1995.09.26 |
申请号 |
JP19940041569 |
申请日期 |
1994.03.11 |
申请人 |
FUJITSU LTD |
发明人 |
ICHIMURA TERUHIKO;NASU YASUHIRO;MATSUMOTO TOMOTAKA |
分类号 |
G02F1/136;C23C16/50;G02F1/1368;H01L21/205;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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