发明名称 FABRICATION OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To provide a method for forming a thin film transistor in a liquid crystal display in which the contact resistance between an a-Si layer and an ITO film is lowered and the opening rate is increased while simplifying the process. CONSTITUTION:The method for fabricating a semiconductor device comprises a step for forming an insulating film 27b on a semiconductor layer 26a, and a step for exposing the semiconductor layer 26a to a low energy plasma containing one conductivity type impurities and to a high energy plasma gas containing one conductivity type impurity to form superposed shallow and deep impurity introduced layers in the semiconductor layer 26a on the opposite sides of the insulating film 27b.</p>
申请公布号 JPH07249776(A) 申请公布日期 1995.09.26
申请号 JP19940041569 申请日期 1994.03.11
申请人 FUJITSU LTD 发明人 ICHIMURA TERUHIKO;NASU YASUHIRO;MATSUMOTO TOMOTAKA
分类号 G02F1/136;C23C16/50;G02F1/1368;H01L21/205;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
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