| 摘要 |
PURPOSE: To obtain small angle scattering X-ray equipment which is optimum for an analyzing method of small angle X-ray scattering for obtaining knowledge on a density structure relating to an observed element by utilizing a phenomenon of extraordinary scattering of an X ray. CONSTITUTION: An incident X ray from an X-ray source 1 is made monochromatic by a spectroscope 3 and then cast on a sample 5. A scattered X ray from the sample is passed through a slit 7 and, exposed and accumulated on an X-ray detector 9. After the exposure of a small angle X ray with energy E1, the spectroscope 3 and the slit 7 are controlled in linkage through a controller 13 from a computer 14, by a spectroscope drive part 10 and a slit drive part 12 respectively, and the scattered X ray with energy E2 is exposed and accumulated on the detector 9 at a different position from the one for the X ray with E1. After this operation is repeated till prescribed energy Ei, are images of the scattered X rays on the detector 9 are read out. A scattering pattern of a density structure relating to an observed element is extracted from small angle X-ray scattering patterns of discrete energy thus obtained. |
