发明名称 SCANNING CONTROL TYPE ANALYSER
摘要 PURPOSE: To shorten a data collection time without lowering the response characteristic of a high voltage power supply. CONSTITUTION: A control circuit 1 generating not only sweep data for scanning but also a response changeover signal corresponding to the step width of a given analytical condition, a plurality of constant circuits Cf1, Cf2, Rf, Rs different in circuit constant and selection circuits SW1, SW2 changing over the constant circuits Cf1, Cf2, Rf, Rs selectively on the basis of the response changeover signal are provided and a power supply circuit 3 changing a response characteristic by the selective changeover of the circuit constants to perform scanning corresponding to the sweep data is provided to enhance the response characteristic corresponding to the magnitude of the step width. Therefore, when the step width is large, the response characteristic is enhanced to enable the shortening of a data collection time.
申请公布号 JPH08170949(A) 申请公布日期 1996.07.02
申请号 JP19940314391 申请日期 1994.12.19
申请人 JEOL LTD 发明人 YANAKA YUJI
分类号 G01N23/22 主分类号 G01N23/22
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