发明名称 Analyzing device similarity
摘要 A method is used in analyzing device similarity. Data describing a device is received and a similarity analysis is applied to the data. Based on the similarity analysis, a measure of similarity between the device and a previously known device is determined.
申请公布号 US9460390(B1) 申请公布日期 2016.10.04
申请号 US201113332889 申请日期 2011.12.21
申请人 EMC Corporation 发明人 Lin Derek;Kaufman Alon;Villa Yael
分类号 G06N7/00;G06N5/04 主分类号 G06N7/00
代理机构 代理人 Gupta Krishnendu;Reyes Jason A.
主权项 1. A method for use in analyzing device similarity, the method comprising: receiving data describing a set of devices, wherein the set of devices includes an unknown device and a previously known device, wherein the data includes a plurality of components associated with the set of devices, wherein the components include device hardware element data and application data, wherein each component of the plurality of components is measured by weight of popularity and frequency, and wherein the weight of each component of the plurality of components changes dynamically based on changing of the popularity and the frequency of use of the plurality of components; based on the data, collecting unlabeled pairs of components in connection with the set of devices in which each pair is observed matching status for each component, wherein the said collecting enables preparation of multi-dimensional vectors for use in connection with training vectors stored in a matrix, wherein each component is represented in the multi-dimensional vectors by the group consisting of matching components, mismatching components, and missing components; projecting, by a principal component analysis using singular value decomposition, the matrix to a lower dimensional space or latent space; based on a cosine similarity angle, determining a pair of vectors maximally apart in the latent space; determining, from the pair, the vector corresponding to a high dimensional vector where all or nearly all components match; utilizing the said determined vector as an origin; and determining a deviation from the origin for defining a device match similarity score.
地址 Hopkinton MA US