发明名称 METHOD AND EQUIPMENT FOR RESPONSE ANALYSIS OF SEMICONDUCTOR MATERIAL USING OPTICAL STIMULATION
摘要 PROBLEM TO BE SOLVED: To provide a response analysis method and device using optical pumping, capable of detecting charge carrier wave having high excitation output and short charge carrier life with sufficiently high precision for detecting a radioactive channel and non-reductive channel of charge carrier recouping, using optical pumping of semiconductor, and to enable individual evaluation of each channel. SOLUTION: The intensity of exciting laser beams is modulated by two non-continuous modulation frequencies Ω1, Ω2, so as to measure the luminescent beams emitted from an objective 4 with respect to the difference frequency Ω-Ω2 for analyzing the luminescent beams as a function of arithmetical mean of the modulation frequencies Ω1, Ω2. In such a constitution, a method and device are utilized in the semiconductor industry for determining different electrical parameters of semiconductor materials.
申请公布号 JPH08335617(A) 申请公布日期 1996.12.17
申请号 JP19960077237 申请日期 1996.03.29
申请人 IENOPUTEITSUKU AG 发明人 MATEIASU BUAAKUNAA;HANSUUDEIITAA GAIRAA
分类号 G01J3/28;G01N21/63;G01N21/64;G01R31/265;G01R31/28;H01L21/66 主分类号 G01J3/28
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