发明名称 FUSE BANK FOR INTEGRATED CIRCUIT WITH ADDITIONAL DUMMY STRUCTURE AND ITS FORMATION
摘要 PROBLEM TO BE SOLVED: To raise the reliability on a fuse link, and accelerate the repeating cutting by laser, by accelerating the etching action improved for forming a vertical sidewall for a fuse link. SOLUTION: In a fuse bank for an integrated circuit, the fuse bank is composed of the arrays 21, 22, and 23 of fuse links and dummy structure of arrays 24, 25, and 26 being put between close to the fuse links so as to accelerate the formation of vertical sidewalls and fixed height of the fuse links, whereby the fuse links can be cut with reliability and reproducibility by laser.
申请公布号 JPH0917960(A) 申请公布日期 1997.01.17
申请号 JP19960114723 申请日期 1996.05.09
申请人 INTERNATL BUSINESS MACH CORP <IBM>;SIEMENS AG 发明人 AREKISANDAA MITOWARUSUKII;JIEIMUSU GAADENAA RAIAN
分类号 B23K26/00;B23K26/38;H01L21/304;H01L21/82;H01L21/822;H01L23/525;H01L27/04 主分类号 B23K26/00
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