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发明名称
SEMICONDUCTOR TEST DEVICE
摘要
申请公布号
JPH09113587(A)
申请公布日期
1997.05.02
申请号
JP19950294824
申请日期
1995.10.18
申请人
ADVANTEST CORP
发明人
MATSUSHITA SHIGERU
分类号
G01R31/3183;G06F11/22;G06F12/16
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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