| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device and its testing method capable of reducing the cost and manhour of a test by testing a derived machine having the contents of a different optional ROM and derived from an one-chip microcomputer by a common test program. SOLUTION: The integrated circuit device is constituted so that all parts capable of forming different circuit constitution by changing alminium wiring in a conventional method can be controlled by a register 7 to be accessed by a memory mapped I/O. At the time of executing a test, a selector 3 is controlled by a test terminal 4, the register 7 is accessed from a data input terminal 5 by the memory mapped I/O and the state of a peripheral circuit is optionally set up and tested. A ROM 1 is provided with BIST LFSR 9 to execute a self- test. At the time of practical use, the peripheral circuit is reset, the information of the peripheral circuit is written from a storage circuit 2 storing the information and the circuit matched with user's specification is set up. |
