发明名称 HIGH RESOLUTION AND SENSITIVITY IMAGING SPECTROGRAPH
摘要 A high-resolution, high-throughput imaging echelle spectrograph having a long slit yields high spectral resolution and large spectral coverage simultaneously. The user is able to make quick adjustments of the desired field of view. The overlapping of different spectral orders are separated using a mosaic of interference filters which transmit approximately 50 .ANG. around the selected spectral lines. The spectra recorded by the invention, therefore, are not like any other, where wavelength increases or decreases monotonically along a given direction on an imaging detector. Instead, only selected windows about user selectable spectral regions are recorded simultaneously on the detector.
申请公布号 CA2197052(A1) 申请公布日期 1997.08.09
申请号 CA19972197052 申请日期 1997.02.07
申请人 TRUSTEES OF BOSTON UNIVERSITY 发明人 CHAKRABARTI, SUPRIYA;BAUMGARDNER, JEFFREY L.;VAILLANCOURT, JOHN E.
分类号 G01J3/02;(IPC1-7):G01J3/02 主分类号 G01J3/02
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