发明名称 EQUIPMENT AND METHOD FOR TESTING INTEGRATED SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide equipment and a method for testing an integrated system which enable improvement of an operation efficiency of the test and quick specification of the portion of failure, regarding the test of the integrated system which is accompanied by the problem of requiring much labor and time. SOLUTION: Equipment and a method for testing an integrated system which are provided with a measuring apparatus group 20 comprising a plurality of measuring apparatuses for testing a plurality of radio sets in a radio set group 50 and others of the integrated system and with a switching part 3 switching over a state of connection between each radio set 5 in the radio set group 50 and each measuring apparatus 2 in the measuring apparatus group 20 and wherein a control part 1 equipped with a correspondence table 11 for specifying a connective pair of the radio set (faulty apparatus) and the measuring apparatus, as the information on connection corresponding to failure data, reads the failure data, specifies the information on connection in the correspondence table 11, outputs test data to the measuring apparatus specified according to the information on connection, receives measured data being the results of the test from the measuring apparatus and specifies the portion of the failure.</p>
申请公布号 JPH09304129(A) 申请公布日期 1997.11.28
申请号 JP19960116181 申请日期 1996.05.10
申请人 KOKUSAI ELECTRIC CO LTD 发明人 TAKAGI SEIICHI;ONISHI SHINJI
分类号 G01D21/00;H04B3/46;(IPC1-7):G01D21/00 主分类号 G01D21/00
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