发明名称 IC TEST HANDLER
摘要 <p>PROBLEM TO BE SOLVED: To provide an IC test handler by which detailed information about each kind of items contained in an operation picture can be easily obtained. SOLUTION: An input-output processing part 162 displays a system operation picture for inputting various set up data and a motion indication necessary for an ordinary motion, and practices a helpfile housed in a hard desk device 182 to prepare a help picture corresponding to each item contained in the operation picture. When any item is indicated by an operator and the display of the help picture is therefore requested, the help picture to explain the contents of the item is displayed.</p>
申请公布号 JPH1138084(A) 申请公布日期 1999.02.12
申请号 JP19970203844 申请日期 1997.07.14
申请人 ADVANTEST CORP 发明人 IKEDA HIROKI
分类号 G01R31/26;G06F3/048;G06F3/14;G09G5/00;G09G5/14;(IPC1-7):G01R31/26 主分类号 G01R31/26
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