发明名称 Method for fabricating a titanium resistor
摘要 According to the preferred embodiment of the present invention, an improved resistor and method of fabrication is provided. The method for fabricating a resistive element into an integrated circuit semiconductor device comprises the steps of: depositing a dielectric film, such as silicon nitride; depositing a titanium film upon the dielectric film; and annealing the titanium and dielectric films. This causes titanium to be diffused into the dielectric film. This creates a resistive element having a relatively high resistivity. The preferred embodiment method has the advantage of being easily integrated into conventional integrated circuit fabrication techniques.
申请公布号 US5899724(A) 申请公布日期 1999.05.04
申请号 US19960647392 申请日期 1996.05.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;SIEMENS AKTIENGESELLSCHAFT 发明人 DOBUZINSKY, DAVID MARK;FUGARDI, STEPHEN GERARD;HAMMERL, ERWIN;HO, HERBERT LEI;RAMAC, SAMUEL C.;STRONG, ALVIN WAYNE
分类号 H01L27/04;H01L21/02;H01L21/822;(IPC1-7):H01L21/20 主分类号 H01L27/04
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