| 摘要 |
<p>A differential thermoanalysis device (10) used to examine or determine the parameters of a test sample, especially the phase transition point or specific warmth of the test sample, by means of measurement. The inventive device consists of a heat source (12) and a sensor plate (16) coupled thereto. A test sample coupling zone (18) is arranged on said sensor plate for thermal coupling of a test sample (20), in addition to a reference sample coupling zone (22) for thermal coupling of a reference sample (24) exhibiting a known behaviour with respect to the parameter to be measured or examined. The sensor plate (16) consists of a ceramic or a monocrystalline or polycrystalline thermoelectric semiconductor material, at least inside the test sample and reference sample coupling zones (18, 22). The Seebeck coefficient and temperature development of the semiconductor material can be periodically measured and calculated in order to take the effects of ageing into account.</p> |
