发明名称 OPTICAL PROBE FOR PROXIMITY FIELD
摘要 <p>An optical probe for a proximity field having a fine aperture for generating and/or scattering a proximity field and capable of being formed into arrays for increasing the intensity of the generated and/or scatted proximity field and being suitable for use as an optical memory head, wherein a flat plate lens having a fine lens is disposed on a plane substrate through which an inverted cone-shaped hole is formed with its top as the above aperture and a light source for emitting a ray of light incident on the flat plate lens is disposed above the lens. Since the focus of the lens is positioned at the fine aperture, a ray of light from the light source is efficiently condensed to the fine aperture. The above structure uses a silicon process to permit array-based production and mass-production of the optical probe, providing an applicability to an optical memory head.</p>
申请公布号 WO9940445(A1) 申请公布日期 1999.08.12
申请号 WO1999JP00514 申请日期 1999.02.05
申请人 SEIKO INSTRUMENTS INC.;MITSUOKA, YASUYUKI;CHIBA, NORIO;KASAMA, NOBUYUKI;NIWA, TAKASHI;NAKAJIMA, KUNIO 发明人 MITSUOKA, YASUYUKI;CHIBA, NORIO;KASAMA, NOBUYUKI;NIWA, TAKASHI;NAKAJIMA, KUNIO
分类号 G01B11/30;G01N37/00;G01Q20/02;G01Q60/18;G01Q60/22;G01Q70/02;G01Q70/06;G01Q70/16;G11B7/135;G11B7/22;(IPC1-7):G01N37/00 主分类号 G01B11/30
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