METHOD AND APPARATUS FOR IMPROVING STUCK-AT FAULT DETECTION IN LARGE SCALE INTEGRATED CIRUIT TESTING

摘要

A bus holder for coupling to an integrated circuit bus driven by a plurality of tri-state devices. The bus holder has input and output ports and first and second test ports. Logic circuitry coupled between the respective ports is configured such that application of a logic 0 to the first test port transmits from the input port to the output port whatever logic value is applied to the input port; application of a logic 1 to the first test port and application of a logic 0 to the second test port pulls the output port down to a logic 0; and, application of a logic 1 to both the first and second test ports pulls the output port up to a logic 1.