| 摘要 |
<p>An apparatus for performing electrical and environmental tests on electronic semiconductor devices, which apparatus has an operating region (105) for accommodating the electronic devices, means for driving the electronic devices and that are arranged outside the operating region (105), a plurality of resiliently yielding terminals (250), connected electrically to the driving means, for contacting the electronic devices electrically, and in which apparatus a plurality of support elements (245) for at least one of the resiliently yielding terminals (250) are provided, each support element (245) being removable from the test apparatus.</p> |
