发明名称 TAPE CARRIER FOR SEMICONDUCTOR DEVICE AND TEMPORARY PROTECTION TAPE FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To suppress warpages attributable to a laminated structure and based on a residual moment, by setting a difference between a linear expansion coefficient of a support member of an adhesive tape having a specific adhesion and a linear expansion coefficient of a tape carrier body within a specified range. SOLUTION: Lattice-shaped terminals 11, such as a grid array, are passed through a plastic film from the front surface to the back at predetermined intervals, and resin-filling holes 12 are formed in a tape carrier body 1 so that the holes 12 interpose the terminals. An adhesive tape 2 adhered to the back of the tape carrier is designed so that a difference between a linear expansion coefficientαof a support substrate 21 and a linear expansion coefficientβof the body 1 (the linear expansion coefficient of a portion where the terminals are provided) is within±0.1β. Further, it is designed to exhibit a low adhesion not only to the tape carrier but also to a sealing member, so that a 180 deg. peal adhesive strength of an adhesive layer 22 can be kept at 400 gf or lower for a tape width of 20 mm after the layer 22 has been heated during manufacture of a semiconductor device.
申请公布号 JP2000150586(A) 申请公布日期 2000.05.30
申请号 JP19980334988 申请日期 1998.11.10
申请人 NITTO DENKO CORP 发明人 FURUTA YOSHIHISA;WATANABE YOSHINOBU;KUBOTA TORU
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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