发明名称 FABRICATION METHOD OF FERROELECTRIC CAPACITOR
摘要 PURPOSE: A fabrication method of ferroelectric capacitor is provided to effectively suppress loss according to the generation of etching residue and the etching. CONSTITUTION: A fabrication method of ferroelectric capacitor comprises: a first step forming a first conductive film and a ferroelectric film; a second step forming a first etching mask defining a lower electrode on the ferroelectric film with photoresist; a third step selectively etching the ferroelectric film to form ferroelectric film patterns for exposing the first conductive film and removing the first etching mask; a forth step forming a second conductive film and forming a second etching mask on the second conductive film; and a fifth step selectively etching the second conductive film, ferroelectric film and the first conductive film and then removing the second etching mask.
申请公布号 KR20000044671(A) 申请公布日期 2000.07.15
申请号 KR19980061170 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KWON, SUN YONG;YEOM, SEUNG JIN
分类号 H01L27/10;H01L21/02;H01L21/768;H01L21/8246;H01L27/108;H01L27/115;(IPC1-7):H01L27/10 主分类号 H01L27/10
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