发明名称 |
FABRICATION METHOD OF FERROELECTRIC CAPACITOR |
摘要 |
PURPOSE: A fabrication method of ferroelectric capacitor is provided to effectively suppress loss according to the generation of etching residue and the etching. CONSTITUTION: A fabrication method of ferroelectric capacitor comprises: a first step forming a first conductive film and a ferroelectric film; a second step forming a first etching mask defining a lower electrode on the ferroelectric film with photoresist; a third step selectively etching the ferroelectric film to form ferroelectric film patterns for exposing the first conductive film and removing the first etching mask; a forth step forming a second conductive film and forming a second etching mask on the second conductive film; and a fifth step selectively etching the second conductive film, ferroelectric film and the first conductive film and then removing the second etching mask.
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申请公布号 |
KR20000044671(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061170 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KWON, SUN YONG;YEOM, SEUNG JIN |
分类号 |
H01L27/10;H01L21/02;H01L21/768;H01L21/8246;H01L27/108;H01L27/115;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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