发明名称 FAULT INSPECTING METHOD FOR DIGITAL ELECTRONIC COMPUTER CIRCUIT
摘要 PROBLEM TO BE SOLVED: To obtain a new inspecting method which measures the source current flowing out of a power source and detecting a fault of a signal line in the digital electronic computer circuit by executing a inspection program, which generates variation of the source current and inspecting the fault of the signal line by measuring the source current. SOLUTION: A 1st inspection program executed by a microprocessor 10 of the electronic computer circuit to be inspected, after outputting a signal for generating the effects of a short-circuit fault, is stored in a ROM 11 for 1st inspection. Then when the 1st inspection program is run, while a couple of signal lines 12 an 13 are short-circuited, the fault is initiated and then a time wait routine is inserted. Once the fault is initiated, a peak-holding circuit holds the peak value of the source current. When the held peak value exceeds a set value, it is deemed tat the source current has become abnormal, and a short-circuit fault is decided. The wait time of the time wait routine is so set, that it is not less than the set value.
申请公布号 JP2000207239(A) 申请公布日期 2000.07.28
申请号 JP19990009177 申请日期 1999.01.18
申请人 MIURA CO LTD 发明人 HASHIZUME MASAKI;YOTSUYANAGI HIROYUKI;TAMESADA TAKETOMI;KAYAHARA TOSHIHIRO;TASAKA EIJI
分类号 G06F11/22;G01R31/02;G01R31/3183 主分类号 G06F11/22
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