发明名称 SAFETY DOOR AND DEVICE FOR MANUFACTURING OR INSPECTING SEMICONDUCTOR PROVIDED WITH THE SAFETY DOOR
摘要 PROBLEM TO BE SOLVED: To provide a safety door and a device for manufacturing or inspecting a semiconductor provided with the safety door capable of avoiding an swoshing injury or the like of a hand and finger by sandwiching. SOLUTION: A device for manufacturing or inspecting a semiconductor provided with this safety door is provided with a device body 14 for manufacturing of inspecting the semiconductor, an opening part 18 provided on the device body 14, a first door 20 driven along one axial line 28 by a drive device and covering a part of the opening part 18, and a second door 22 urged toward the first door 20 along the axial line 28 and covering a part of the opening part 18. In the case where a hand and finger are sandwiched by an automatic door when the opening part 18 is closed, the second door 22 closing a part of the opening part 18 in only an urged state is moved to the drive direction of the first door 20, since the first door 20 is stopped at a position covering only a part of the opening part 18, only pressure urging the second door does not act on the hand and finger, and a risk for crushing the hand and finger can be avoided.
申请公布号 JP2000226964(A) 申请公布日期 2000.08.15
申请号 JP19990278510 申请日期 1999.09.30
申请人 TOKYO SEIMITSU CO LTD 发明人 HIRANUMA KAZUNORI;MANPUKU YASUHIRO;TAKASHINA MAMORU
分类号 E05F7/00;B01J19/00;E05F15/04 主分类号 E05F7/00
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