发明名称 FAR-ULTRAVIOLET RAY DRY PHOTOLITHOGRAPHY
摘要 PROBLEM TO BE SOLVED: To permit dry photolithography by which a film having high photosensitivity and high stability is formed by forming a layer of a stable plasma polymer of an organosilane using trimethylsilane or another compound having a high carbon to silicon ratio as a precursor. SOLUTION: Trimethylsilane is allowed to flow into a processing chamber containing a substrate, plasma is generated from the trimethylsilane and a layer of a plasma polymer of trimethylsilane is formed on the substrate. Part of the layer is selected and exposed in an oxidizing atmosphere, at least part of the selected part of the layer is oxidized, and exposed and unexposed parts are formed. The layer is then developed by an etching process to selectively remove the exposed or unexposed part. Light for the exposure preferably has a wavelength of about <=248 nm. The etching process is preferably carried out using plasma with oxygen and halogen.
申请公布号 JP2000305273(A) 申请公布日期 2000.11.02
申请号 JP19990330022 申请日期 1999.11.19
申请人 APPLIED MATERIALS INC 发明人 DIANE SUGIAATO;DAVID MUI
分类号 G03F7/075;G03F7/36;H01L21/027;H01L21/302;H01L21/3065 主分类号 G03F7/075
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