发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A nonvolatile semiconductor memory device is provided to improve a photolithography process within a memory cell array area. CONSTITUTION: A nonvolatile semiconductor memory device comprises a memory cell array consisting of first/second select transistors, a plurality of bit lines commonly connected to a drain of the transistors, and a plurality of word lines connected to a gate of the transistors. The gate(GS/L11) of the first select transistor shares the bit lines and drain, and has a structure into which a first polysilicon layer(106), an interlayer dielectric and second/third polysilicon layers(110,114) are stacked. A first gate contact window(10) consists of second/third polysilicon layers laminated in a dummy area transversely disposed to the bit lines. A second gate contact window(20) consists of second/third polysilicon layers laminated over a connected gate.
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申请公布号 |
KR100285755(B1) |
申请公布日期 |
2001.01.05 |
申请号 |
KR19970069211 |
申请日期 |
1997.12.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, JEONG DAL;KIM, DONG JUN |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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地址 |
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