发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND CONTROL METHOD THEREFOR |
摘要 |
<p>PROBLEM TO BE SOLVED: To basically prevent normal operation of a defective chip. SOLUTION: This semiconductor integrated circuit device is provided with a chip operation disablement control circuit 10 provided with a fusing section in which it is decided whether cutting is performed or not in a manufacturing process conforming to judgment of a good or defective chip and of which one end is connected to a first power source, and a signal generating section which is connected between the other end of this fusing section and a second power source and generating a discrimination signal indicating whether it is a defective chip or not conforming to existence of cutting of the fusing section and supplying the discrimination signal to at least one out of chip internal function circuits 11-14, in the chip. Then the chip internal function circuit is activated or non- activated based on the value of a discrimination signal.</p> |
申请公布号 |
JP2001014886(A) |
申请公布日期 |
2001.01.19 |
申请号 |
JP20000172463 |
申请日期 |
2000.06.08 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KYO SHOSEKI;SHIN KEIZEN;KYO KISO |
分类号 |
G11C11/413;G01R31/26;G11C16/06;G11C29/00;G11C29/04;H01L23/58;(IPC1-7):G11C29/00 |
主分类号 |
G11C11/413 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|