发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND CONTROL METHOD THEREFOR
摘要 <p>PROBLEM TO BE SOLVED: To basically prevent normal operation of a defective chip. SOLUTION: This semiconductor integrated circuit device is provided with a chip operation disablement control circuit 10 provided with a fusing section in which it is decided whether cutting is performed or not in a manufacturing process conforming to judgment of a good or defective chip and of which one end is connected to a first power source, and a signal generating section which is connected between the other end of this fusing section and a second power source and generating a discrimination signal indicating whether it is a defective chip or not conforming to existence of cutting of the fusing section and supplying the discrimination signal to at least one out of chip internal function circuits 11-14, in the chip. Then the chip internal function circuit is activated or non- activated based on the value of a discrimination signal.</p>
申请公布号 JP2001014886(A) 申请公布日期 2001.01.19
申请号 JP20000172463 申请日期 2000.06.08
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KYO SHOSEKI;SHIN KEIZEN;KYO KISO
分类号 G11C11/413;G01R31/26;G11C16/06;G11C29/00;G11C29/04;H01L23/58;(IPC1-7):G11C29/00 主分类号 G11C11/413
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