发明名称 EPITAXIAL WAFER FOR INFRARED EMISSION DIODE AND LIGHT- EMITTING ELEMENT USING THE SAME
摘要 PROBLEM TO BE SOLVED: To allow a high output by establishing a relationship expressed by a specific equation between the carrier concentration at a position away from, by a specified distance, the interface with a window layer toward a Ga1-xAlxAs layer and the thickness of a p-type layer of Ga1-xAlxAs layer. SOLUTION: Relations such as 10<(Lp)<30, 30<(Cp)&times;(Lp)<100 are established between the carrier concentration (Cp: unit 1017 cm-3) at a position separated by 2 &mu;m, an interface between a Ga1-xAlxAs layer 4 and a window layer 3 toward the Ga1-xAlxAs layer 4 and the thickness (Lp: in units of 10-4 cm) of a p-type layer in the Ga1-xAlxAs layer 4. If parameters satisfy these relations, an epitaxial wafer constituting a light-emitting element of high output which is superior in forward voltage characteristics is provided. With the use of epitaxial wafer of this configuration, a light-emitting element of high output with a low forward voltage is provided.
申请公布号 JP2001077410(A) 申请公布日期 2001.03.23
申请号 JP19990251079 申请日期 1999.09.06
申请人 SHOWA DENKO KK 发明人 WATANABE TAKASHI
分类号 H01L33/14;H01L33/30 主分类号 H01L33/14
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