发明名称 RADIATION SENSITIVE COPOLYMERS, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEMS THEREOF
摘要 <p>Radiation sensitive resins for use in a top layer resists in bilayer systems for use in deep UV photolithography comprises copolymers having structural units (I) and optionally (III), wherein n is an integer of 1 to 5, R1 is methyl or trimethylsiloxy, R2 is a tert-butyl group, R?3, R4 and R5¿ are each independently hydrogen or a methyl group.</p>
申请公布号 WO2001022163(A2) 申请公布日期 2001.03.29
申请号 US2000022142 申请日期 2000.08.11
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