发明名称 Semiconductor device
摘要 An n−-type semiconductor substrate (1) includes an active region and a terminal region disposed outside the active region. A p+-type anode layer (2) is formed in a portion of an upper surface of the n−-type semiconductor substrate (1) in the active region. A plurality of p+-type guard ring layers (3) are formed in a portion of the upper surface of the n−-type semiconductor substrate (1) in the terminal region. An n+-type cathode layer (5) is formed in a lower surface of the n−-type semiconductor substrate (1). An anode electrode (6) is connected to the p+-type anode layer (2). A metallic cathode electrode (7) is connected to the n+-type cathode layer (5). A recess (8) is formed by trenching the n+-type cathode layer (5) in the terminal region. The cathode electrode (7) is also formed in the recess (8).
申请公布号 US9455355(B2) 申请公布日期 2016.09.27
申请号 US201314888780 申请日期 2013.07.08
申请人 Mitsubishi Electric Corporation 发明人 Otsuki Eiko;Sadamatsu Koji;Yoshiura Yasuhiro
分类号 H01L29/861;H01L29/06;H01L29/66;H01L29/739;H01L29/08 主分类号 H01L29/861
代理机构 Studebaker & Brackett PC 代理人 Studebaker & Brackett PC
主权项 1. A semiconductor device comprising: a substrate including an active region and a terminal region disposed outside the active region; a p+-type anode layer formed in a portion of an upper surface of the substrate in the active region; a plurality of p+-type guard ring layers formed in a portion of the upper surface of the substrate in the terminal region; an n+-type cathode layer formed in a lower surface of the substrate; an anode electrode connected to the p+-type anode layer; and a metallic cathode electrode connected to the n+-type cathode layer, wherein a recess is formed by completely removing the n+-type cathode layer in the terminal region, and the cathode electrode is also formed in the recess.
地址 Tokyo JP