发明名称 DELAY TIME MEASURING DEVICE AND METHOD AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <p>PROBLEM TO BE SOLVED: To improve the measurement accuracy of a delay time of a measuring circuit by equalizing the delay time Tm of the measuring circuit pass to the delay time Td of a dummy circuit pass in the method for measuring the delay time Tpd(=Tm-Td) of the measuring circuit by subtracting the delay time Td of the dummy circuit pass of the constitution bypassing the measuring circuit from the delay time of the measuring circuit pass including the measuring circuit. SOLUTION: In order to meet the transition time of an output terminal Smo of the measuring circuit pass with the output terminal Sdo of a dummy circuit pass, a phase detection means 5 outputs a delay control signal 17, controls the delay time of a variable delay time circuit 4 connecting the input terminal Sdi of the dummy circuit pass. As the results, the delay time Tpd of the measuring circuit 8 is controlled to be the same as the delay time of the variable delay time circuit 4.</p>
申请公布号 JP2001264397(A) 申请公布日期 2001.09.26
申请号 JP20000072153 申请日期 2000.03.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TOMITA YASUHIRO
分类号 G04F10/06;G01R31/28;G01R31/319;H03K5/13;(IPC1-7):G01R31/319 主分类号 G04F10/06
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