发明名称 |
METHOD FOR FABRICATING PATTERN USING SUPPORTING ASSEMBLY WITH ROLLING MEMBER DISPOSED BELOW SUPPORTING RODS AND SEMICONDUCTOR FABRICATION APPARATUS HAVING THE SUPPORTING ASSEMBLY |
摘要 |
A method for fabricating a pattern on a semiconductor substrate, comprising the steps of: (a) providing the semiconductor substrate having a photosensitive layer thereon; (b) transmitting the semiconductor substrate to an exposure apparatus including several tubes; (c) providing the supporting assembly to support the tubes, where the supporting assembly includes a first supporting rod having several first parallel recesses, a second supporting rod disposed opposite to the first supporting rod, a bridging member connected to one end of the first supporting rod or one end of the second supporting rod; and a rolling member received by the bridging member; (d) providing a photomask to the exposure apparatus; and (e) transferring the pattern from the photomask to the photosensitive layer. |
申请公布号 |
US2016299434(A1) |
申请公布日期 |
2016.10.13 |
申请号 |
US201615190165 |
申请日期 |
2016.06.22 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Wu Chien-Ju;Wu Ming-Sung |
分类号 |
G03F7/20;H01L21/033 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a pattern on a semiconductor substrate, comprising the steps of:
(a) providing the semiconductor substrate having a photosensitive layer thereon; (b) transmitting the semiconductor substrate to an exposure apparatus comprising a plurality of tubes; (c) providing a supporting assembly to support the tubes, wherein the supporting assembly comprises:
a first supporting rod comprising a plurality of first parallel recesses, wherein the first parallel recesses are configured to receive the tubes;a second supporting rod disposed opposite to the first supporting rod;a bridging member connected to one end of the first supporting rod or one end of the second supporting rod; anda rolling member received by the bridging member; (d) providing a photomask to the exposure apparatus, wherein the photomask comprises a pattern; and (e) transferring the pattern from the photomask to the photosensitive layer. |
地址 |
Hsin-Chu City TW |