发明名称 |
Scanning charged particle microscope, and focal distance adjusting method and astigmatism correction method thereof |
摘要 |
In order to provide a method to easily and surely adjust the focal distance as in a Wobbler apparatus of the transmission type electron microscope method, a crossover 11 of a charged particle beam 2 is established between a charged particle gun 1 and an objective lens 6 and a beam deflection device 4 is provided to deflect the charged particle beam at the crossover point as the supporting point. A total controller 9 calculates an amount of the out of focus from a moving amount of the microscopic image obtained by deflecting the beam and orders the objective lens power supply to move the microscopic image as the focal distance.
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申请公布号 |
US2001050338(A1) |
申请公布日期 |
2001.12.13 |
申请号 |
US20010870512 |
申请日期 |
2001.06.01 |
申请人 |
NOMURA SETSUO |
发明人 |
NOMURA SETSUO |
分类号 |
H01J37/22;G01N23/04;G21K7/00;H01J37/08;H01J37/14;H01J37/147;H01J37/153;H01J37/21;(IPC1-7):G21K7/00;G01N23/00 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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