发明名称 SEMICONDUCTOR SENSOR AND ITS MANUFACTURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor sensor and its manufacturing method capable of reducing the cost, having strong mechanical strength, and capable of making high-precision measurement. SOLUTION: In Fig. 2 (a), an impurity diffusion area 2 is formed as a lower electrode on the surface of a Si substrate, then a plurality of trenches are formed in the impurity diffusion area 2 by a dry etching method. In Fig. 2 (b), the Si substrate 1 is annealed in a high-temperature state so that the surface is not oxidized. When annealing is applied, Si flows to minimize the surface area, and a cavity section 6 is formed in the Si substrate 1. In Fig. 2 (c), a high-concentration impurity diffusion area 7 is formed as an upper electrode on a diaphragm section 10. In Fig. 2 (d), an insulating layer 8 is formed on the surface of the Si substrate 1, and metal wiring 9 is formed. Since a plurality of trenches are formed in the impurity diffusion area 2 and annealing is applied, a pressure reference chamber and the diaphragm section can be simultaneously formed.</p>
申请公布号 JP2002005763(A) 申请公布日期 2002.01.09
申请号 JP20000180123 申请日期 2000.06.15
申请人 HITACHI LTD;HITACHI CAR ENG CO LTD 发明人 SUKESAKO HIROYASU;HANZAWA KEIJI;HORIE JUNICHI
分类号 G01F1/692;G01L9/00;G01L9/04;G01L9/12;G01P15/125;H01L29/84;(IPC1-7):G01L9/04 主分类号 G01F1/692
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