| 摘要 |
<p>PROBLEM TO BE SOLVED: To enhance the visibility and space resolution of a phase contrast X-ray imaging device. SOLUTION: In the phase cotrast X-ray imaging device using an X-ray interferometer, a simultaneous reflection type X-ray interferometer is used wherein a signal wave is coupled to a reference wave by the simultaneous reflection of a coplanar or nonplanar Bragg case instead of coupling the signal wave to the reference wave by the diffraction of a Laue case as in the past.</p> |
