| 摘要 |
PURPOSE: Semiconductor integrated circuit including a test facilitation circuit for functional blocks intellectual properties and automatic inserting is provided to realize a semiconductor integrated circuit in which an effective, high-quality test on the functional blocks (IPs) provided inside the SOC having few outer terminals is achieved and an automatic insertion method of the same test facilitation circuit. CONSTITUTION: The device includes a selection circuit which selects any one of plural inputs; a bi-directional selection circuit which exchanges data bi-directionally; the functional block including an input terminal connected to an output terminal of other functional block and an input terminal of the semiconductor integrated circuit through the selection circuit, and a bi-directional terminal connected to the bi-directional terminal of the other functional block and a bi-directional terminal of the semiconductor integrated circuit through the bi-directional selection circuit; and a test result storage circuit which functions as a test facilitation circuit such that it is connected to an output terminal of the functional block, receives test results of plural bits (n) in parallel from the functional block, signature-compresses the test results, and outputs the signature-compressed data from an output terminal of the semiconductor integrated circuit in the unit of m
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