| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an X-ray diffraction apparatus by which the height direction of a sample and the inclination of the face of the sample can be adjusted precisely and easily with a simple constitution. SOLUTION: The X-ray diffraction apparatus is provided with a mechanism which adjusts the height direction continuously and a mechanism which adjusts the height direction stepwise. By the continuous adjusting mechanism, the inclination of the sample is adjusted, and its height is finely adjusted. By the stepwise adjusting mechanism, the height direction of the sample is adjusted. A positioning part is installed, and the height position of the sample is decided. The continuous adjusting mechanism 10 is constituted of feed screw mechanisms 21, 22, 23 equipped with feed screws. When the feed screws in a plurality are driven individually, the inclination is adjusted, and the height is finely adjusted. In the stepwise adjusting mechanism 20, a support part which supports a sample mounting part is constituted of blocks 11, 12, 13. When the length of each attached block is changed, the height direction is adjusted.</p> |
