发明名称 Negative voltage generating circuit with high control responsiveness which can be formed using transistor with low breakdown voltage and semiconductor memory device including the same
摘要 A voltage generating circuit of the present invention includes a charge pump regulator and a voltage converting circuit. Charge pump regulator receives Ext.Vcc and a ground voltage as inputs and outputs a negative voltage Vbb1. Charge pump regulator receives Int.Vcc and negative voltage Vbb1 as inputs and outputs negative voltage Vbb2(<Vbb1). Voltage converting circuit receives Int.Vcc and negative voltage Vbb2 as inputs and outputs an output voltage Vnn. In each of charge pump regulator, a voltage difference between the input and the output is designed such that it is equal to or lower than a prescribed value determined by a size of a transistor.
申请公布号 US6385117(B2) 申请公布日期 2002.05.07
申请号 US20010843691 申请日期 2001.04.30
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MORISHITA FUKASHI
分类号 G11C11/413;G11C5/14;G11C11/407;G11C11/4074;G11C16/06;H02M3/07;(IPC1-7):G11C8/00 主分类号 G11C11/413
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