发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device is disclosed including an IGFET (insulated gate field effect transistor) and a method of manufacturing the same. The semiconductor device may include an oxide film (115) or a nitride film (106) provided on a side surface of a gate electrode in such a manner that an overhang condition may not occur. In this way, operating characteristics of the IGFET may not be deteriorated and voids may not appear in filling regions of an interlayer insulating film so that isolation characteristics may not be deteriorated.
申请公布号 US2002079492(A1) 申请公布日期 2002.06.27
申请号 US20010991093 申请日期 2001.11.13
申请人 KOGA HIROKI 发明人 KOGA HIROKI
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L21/60;H01L21/768;H01L21/8234;H01L23/52;H01L27/088;H01L29/423;H01L29/43;H01L29/49;H01L29/78;(IPC1-7):H01L29/04;H01L31/036;H01L31/037 主分类号 H01L21/28
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