发明名称 Method for designing photolithographic reticle layout, reticle, and photolithographic process
摘要 There are provided methods of creating a phase shift mask, comprising storing a file representing a binary mask layout as one or more cells, or as a hierarchy of a plurality of cells, at least some of which cells contain printable shapes; for each cell, determining if the cell contains a printable shape; if the cell has a printable shape, determining if the cell will print desired features in a wafer fabrication process and if so, leaving the cell alone; if the cell has a printable shape which will not print desired features in the wafer fabrication process, providing phase shift areas adjacent the printable shape so that it will print desired features; and using the cells to produce a phase shift mask. There are further provided embodiments of steps for generating such phase shift areas. In addition, there are provided photolithographic processes comprising directing exposure onto a resist through a mask formed using such methods. There are further provided systems comprising a computer readable storage medium containing program instructions for execution by a processor to design a mask; and a processor for executing the program instructions stored on the computer readable storage medium for performing such methods.
申请公布号 US6416907(B1) 申请公布日期 2002.07.09
申请号 US20000559262 申请日期 2000.04.27
申请人 MICRON TECHNOLOGY, INC. 发明人 WINDER AMY A.;JUENGLING WERNER
分类号 G03F1/00;G03F7/20;(IPC1-7):G03F9/00;G06F17/50 主分类号 G03F1/00
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