发明名称 Time-delay-and-integrate image sensors having variable integration times
摘要 In various embodiments, a time-delay-and-integrate (TDI) image sensor includes (i) a plurality of integrating CCDs (ICCDs), arranged in parallel, that accumulate photocharge in response to exposure to light, (ii) electrically coupled to the plurality of ICCDs, a readout CCD (RCCD) for receiving photocharge from the plurality of ICCDs, and (iii) electrically coupled to the RCCD, readout circuitry for converting charge received from the RCCD into voltage.
申请公布号 US9503606(B2) 申请公布日期 2016.11.22
申请号 US201213625296 申请日期 2012.09.24
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 Compton John Thomas
分类号 H04N1/193;H04N3/14;H04N5/372;H04N1/40 主分类号 H04N1/193
代理机构 代理人
主权项 1. An imaging system comprising: a time-delay-and-integrate (TDI) image sensor comprising (i) a plurality of identical integrating CCDs (ICCDs), arranged in parallel and abutting each other, that accumulate photocharge in response to exposure to light, (ii) electrically coupled to the plurality of ICCDs, a readout CCD (RCCD) for receiving photocharge from the plurality of ICCDs, and (iii) electrically coupled to the RCCD, readout circuitry for converting charge received from the RCCD into voltage; an optical system for receiving light from a scene to be imaged and projecting it on the plurality of ICCDs; and wherein each ICCD comprises (i) a plurality of independently controllable stages, (ii) a photosensitive channel for containing photocharge and a channel stop to produce a barrier to separate each ICCD from adjacent ICCDs, (iii) for each of a plurality of charge collection regions, a sense node located between the photosensitive channel and the channel stop for measuring photocharge received thereby from the photosensitive channel, and (iv) for each of the plurality of charge collection regions, a gate for controlling flow of photocharge from the photosensitive channel to the sense node, and the imaging system comprises, for each charge collection region, a spillover charge measurement circuit to alternatively reset the sense node and measure a charge in the sense node of an associated charge collection region.
地址 Phoenix AZ US