发明名称 DIGITAL CIRCUIT DEVICE, AND METHOD OF TESTING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To precisely conduct clock distribution even when delay time fluctuation is generated cauded by fluctuation of a device operation condition, in a digital circuit device. SOLUTION: In this digital circuit device, the delay time fluctuation accompanied to the fluctuation of the device operation condition is corrected by circuit parts 10A-10C for measuring delay times in delay circuits 1A-1C for phase shift regulation, operation circuits B (11A-C) for computing fluctuation ratios based on measured values, and operation circuits A (12A-C) provided in the respective delay circuits to calculate fluctuation amounts based on the fluctuation ratios.
申请公布号 JP2002267725(A) 申请公布日期 2002.09.18
申请号 JP20010365532 申请日期 2001.11.30
申请人 HITACHI LTD 发明人 ORIHASHI RITSURO;INUDOU KOUSUKE;HAYASHI YOSHIHIKO
分类号 G01R31/28;G06F1/04;G06F1/10;H03K5/14;H03L7/00;H03L7/081 主分类号 G01R31/28
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